ASTM STP33847S PDF
Radiation-Induced Segregation in Light-Ion Bombarded Ni-8% Si
Radiation-Induced Segregation in Light-Ion Bombarded Ni-8% Si
- Статус документа:
- D
- Формат:
- Электронный (PDF)
- SKU:
- ASTM STP33847S
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Abstract
Radiation-induced segregation (RIS) is an important area of current research because of potential detrimental effects including embrittlement. In this work, a quantitative assessment is made of radiation-induced silicon segregation to inter...
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