BS EN 15991:2015 PDF
Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
- Статус документа:
- Отменён
- Формат:
- Электронный (PDF)
- Дата публикации:
- 30 ноября 2015 г.
- ICS:
- 81.060.10
- SKU:
- BS EN 15991:2015
Abstract
What is BS EN 15991 - Testing ceramic and basic materials about?
BS EN 15991 is a European Standard. BS EN 15991 defines a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V, and Zr in powdered and granular silicon carbide. Dependent on the element, wavelength, plasma conditions, and weight, this test method applies for mass contents of the above trace contaminations from about 0,1 mg/kg to about 1 000 mg/kg, after evaluation also from 0,001 mg/kg to about 5 000 mg/kg. After adequate verification, BS EN 15991 is also applicable to further metallic elements (excepting Rb and Cs) and some non-metallic contaminations (like P and S) and other allied non-metallic powdered or granular materials like carbides, nitrides, graphite, soot, coke, coal, and some other oxidic materials. BS EN 15991 discusses scope, principle, spectrometry, and much more in a very detailed format. Note 1: Generally, for optical emission spectrometry using inductively coupled plasma (ICP OES) and electrothermal vaporization (ETV) there is a linear working range of up to four orders of magnitude. This range can be expanded for the respective elements by variation of the weight or by choosing lines with different sensitivity. Note 2: There is a positive experience with materials like, for example, graphite, B4C, Si3N4, BN, and several metal oxides as well as with the determina...
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