BS EN 60749-3:2017 PDF
Semiconductor devices. Mechanical and climatic test methods - External visual examination
Semiconductor devices. Mechanical and climatic test methods - External visual examination
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Дата публикации:
- 30 ноября 2017 г.
- ICS:
- 31.080.01
- Технический комитет:
- CENELEC
- SKU:
- BS EN 60749-3:2017
Abstract
What is BS EN IEC 60749-3 - External visual examination of semiconductor devices about?
BS EN IEC 60749 is an international standard covering external visual examination of semiconductor devices that facilitates testing, classification and applicability of semiconductor devices. The purpose of BS EN IEC 60749 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. In BS EN IEC 60749 , is an external visual inspection is a non-destructive test and is applicable for all package types. The test is use...
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