BS EN 61788-15:2011 PDF

1   Scope This part of IEC 61788 describes measurements of the intrinsic surface impedance ( Z S ) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method [13, 14] 2 . The object of measurement is to obtain the temperature dependence of the intrinsic Z S at the resonant frequency f 0 . The frequency and thickness range and the measurement resolution for the intrinsic Z S of HTS films are as follows:

– frequency: up to 40 GHz;

– film thickness: greater than 50 nm;

– measurement resolution: 0,01 mΩ at 10 GHz.

The intrinsic Z S data at the measured frequency, and that scaled to 10 GHz, assuming the f 2 rule for the intrinsic surface resistance R S ( f < 40 GHz) and the f rule for the intrinsic surface reactance X S for comparison, shall be reported.