BS EN 62373:2006 PDF
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Дата публикации:
- 29 сентября 2006 г.
- ICS:
- 31.080.30
- Технический комитет:
- CENELEC
- SKU:
- BS EN 62373:2006
Abstract
What is BS EN 62373 - Bias-temperature stability test method for MOSFET about?
BS EN 62373 is an international standard used for Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET). This helps in manufacturing good quality metal-oxide-semiconductor, field-effect transistors (MOSFET). BS EN 62373 provides a test procedure for a bias-temperature (BT) stability test of metal-oxide-semiconductor, field-effect transistors (MOSFET).
Who is BS EN 62373 - Bias-temperature stability test method for MOSFET for?
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