BS EN 62374:2007 PDF

Name: BS EN 62374:2007 — Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
SKU: BS EN 62374:2007
Price: 50 EUR
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Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Название (английский):

BS EN 62374:2007

Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Статус документа:: D
Формат:: Электронный (PDF)
Дата публикации:: 31 октября 2008 г.
ICS:: 31.080.01
Технический комитет:: CENELEC
SKU:: BS EN 62374:2007

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Цена:50 €

BS EN 62374:2007 PDF

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