BS IEC 62526:2007 PDF

What is BS IEC 62526 - Extensions to standard test interface language (STIL) for semiconductor design environments about?

BS IEC 62526 is an international standard that discusses extensions to standard test interface language (STIL) for semiconductor design environments. BS IEC 62526 outlines the structures that are defined in STIL to support usage as semiconductor simulation stimulus, including:

Mapping signal names to equivalent design references The interface between scan and built-in self-test (BIST) and the logic simulation Data types to represent unresolved states in a pattern Parallel or asynchronous pattern execution on different design blocks Expression-based conditional execution of pattern constructs

Structures are defined in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher-level device test. Structures are defined in STIL to relate failed information from device testing environments back to the original stimulus and design data elements. Note: Syntax in  BS IEC 62526 is used in the definition of patterns for sub-blocks.