BS IEC 62899-503-3:2021 PDF
Printed electronics - Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
Printed electronics - Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Дата публикации:
- 30 сентября 2021 г.
- ICS:
- 29.045
- SKU:
- BS IEC 62899-503-3:2021
Abstract
1 Scope This PART of IEC 62899 specifies a measuring method of contact resistance for printed thin film transistors (TFTs) by the transfer length method ( TLM ). The method requires the fabrication of a test element group (TEG) with varying channel length ( L ) between source and drain electrodes. The method is intended for quality assessment of TFT electrode contacts and is suited for determining whether the contact resistance lies within a desired range.
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