BS IEC 62951-3:2018 PDF

Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation of thin film transistor characteristics on flexible substrates under bulging

Название (английский):

BS IEC 62951-3:2018

Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation of thin film transistor characteristics on flexible substrates under bulging

Статус документа:: Действующий
Формат:: Электронный (PDF)
Дата публикации:: 30 ноября 2018 г.
ICS:: 31.080.99
SKU:: BS IEC 62951-3:2018

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Abstract

What is BS IEC 62951 ‑ 3 ‒ Evaluation of thin-film transistor characteristics about? BS IEC 62951 ‑ 3 is the third part of an international standard used for semiconductor devices. BS IEC 62951 ‑ 3 specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer, and others.

BS IEC 62951-3:2018 PDF

Abstract

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Abstract

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