BS IEC 63003:2015 PDF
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Дата публикации:
- 31 января 2016 г.
- ICS:
- 25.040.01
- SKU:
- BS IEC 63003:2015
Abstract
What is BS IEC 63003 – Common test interface (CTI) pin map configuration about?
The scope of BS IEC 63003 is the definition of a pin map utilizing the IEEE 1505™ 1 receiver fixture interface (RFI). The pin map defined within BS IEC 63003 shall apply to military and aerospace automatic test equipment (ATE).
Who is BS IEC 63003 – Common test interface (CTI) pin map configuration for?
BS IEC 63003 on common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505 TM is useful for:
Defence agencies
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