BS ISO 12406:2010 PDF

Name: BS ISO 12406:2010 — Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon.
SKU: BS ISO 12406:2010
Price: 50 EUR
Availability: InStock

Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon.

Название (английский):

BS ISO 12406:2010

Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon.

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 24
Дата публикации:: 30 ноября 2010 г.
SKU:: BS ISO 12406:2010

Тип поставки:

Full version360 €Read online 24h10 €Read online 72h15 €

Язык документа:

ruen

Срок поставки:4 раб. дн. (перевод)

Цена:360 €

BS ISO 12406:2010 PDF

Похожие стандарты

BS EN 3841-307:2004

Aerospace series. Circuit breakers. Test methods. Performance with a locked tripping system.

BS ISO/IEC 27050-4:2021

Information technology. Electronic discovery. Technical readiness.

BS ISO 10791-4:1998

Test conditions for machining centres. Accuracy and repeatability of positioning of linear and rotary axes.

BS EN 3697:2013

Aerospace series. Acrylonitrile-butadiene rubber (NBR). Low temperature resistant. Hardness 60 IRHD.

BS EN 12276:2013

Mountaineering equipment. Frictional anchors. Safety requirements and test methods.

BS EN 14822-2:2005

Health Informatics. General purpose information components. Non-clinical.

BS EN 14626:2024

Ambient air. Standard method for the measurement of the concentration of carbon monoxide by non-dispersive in…

BS ISO/IEC 19678:2015

Information Technology. BIOS Protection Guidelines.