BS ISO 22415:2019 PDF

Name: BS ISO 22415:2019 — Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials.
SKU: BS ISO 22415:2019
Price: 50 EUR
Availability: InStock

Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials.

Название (английский):

BS ISO 22415:2019

Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials.

Статус документа:: Действующий
Формат:: Электронный (PDF)
Дата публикации:: 14 мая 2019 г.
SKU:: BS ISO 22415:2019

Тип поставки:

Full version50 €Read online 24h10 €Read online 72h15 €

Язык документа:

ruen

Срок поставки:1 раб. дн. (перевод)

Цена:50 €

BS ISO 22415:2019 PDF

Похожие стандарты

BS EN 3841-307:2004

Aerospace series. Circuit breakers. Test methods. Performance with a locked tripping system.

BS ISO/IEC 27050-4:2021

Information technology. Electronic discovery. Technical readiness.

BS ISO 10791-4:1998

Test conditions for machining centres. Accuracy and repeatability of positioning of linear and rotary axes.

BS EN 3697:2013

Aerospace series. Acrylonitrile-butadiene rubber (NBR). Low temperature resistant. Hardness 60 IRHD.

BS EN 12276:2013

Mountaineering equipment. Frictional anchors. Safety requirements and test methods.

BS EN 14822-2:2005

Health Informatics. General purpose information components. Non-clinical.

BS EN 14626:2024

Ambient air. Standard method for the measurement of the concentration of carbon monoxide by non-dispersive in…

BS ISO/IEC 19678:2015

Information Technology. BIOS Protection Guidelines.