BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods - Vibration, variable frequency
Semiconductor devices. Mechanical and climatic test methods - Vibration, variable frequency
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Дата публикации:
- 30 апреля 2018 г.
- ICS:
- 31.080.01
- Технический комитет:
- CENELEC
- SKU:
- BS EN IEC 60749-12:2018
Abstract
What is BS EN IEC 60749-12 - Variable frequency vibration of semiconductor devices about?
BS EN IEC 60749 is an international standard on semiconductor devices.
BS EN IEC 60749-12 is the 12th part in the multi-series that describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This test method describes a swept sine test.
BS EN IEC 60749-12 is normally applicable to cavity-type packages.
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