BS EN IEC 60749-20:2020
Semiconductor devices. Mechanical and climatic test methods - Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
Semiconductor devices. Mechanical and climatic test methods - Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Дата публикации:
- 31 октября 2020 г.
- ICS:
- 31.080.01
- SKU:
- BS EN IEC 60749-20:2020
Abstract
What is BS EN IEC 60749 ‑ 20 about?
BS EN IEC 60749 ‑ 20 is the 20th part of semiconductor the multi-series European standard on semiconductor devices.
BS EN IEC 60749 ‑ 20 provides a means of assessing the resistance to soldering heat of semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is destructive. <span data-ccp-props='{"...
Похожие стандарты
Упомянутые в описании и другие стандарты BS
IEC 60749-23:2025
ДействующийSemiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Overview IEC 60749-23:2025 - Semiconductor devices: High temperature operating life (HTOL) specifies an accelerated life test to determine the effects of bias conditions and elevated temperature on s…
BS ISO 10835:2007
ДействующийDirect reduced iron and hot briquetted iron. Sampling and sample preparation.
1 Scope This International Standard gives a) the underlying theory, b) the basic principles for sampling and preparation of samples , and c) the basic requirements for the design, installation and op…