BS EN IEC 60749-30:2020
Semiconductor devices. Mechanical and climatic test methods - Preconditioning of non-hermetic surface mount devices prior to reliability testing
Semiconductor devices. Mechanical and climatic test methods - Preconditioning of non-hermetic surface mount devices prior to reliability testing
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Дата публикации:
- 30 сентября 2020 г.
- ICS:
- 31.080.01
- SKU:
- BS EN IEC 60749-30:2020
Abstract
What is BS EN IEC 60749 ‑ 30 about?
BS EN IEC 60749 ‑ 30 is the 30th part of the multimerise Internation standard on semiconductor devices.
BS EN IEC 60749 ‑ 30 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing.
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