BS EN IEC 60749-41:2020
Semiconductor devices. Mechanical and climatic test methods - Standard reliability testing methods of non-volatile memory devices
Semiconductor devices. Mechanical and climatic test methods - Standard reliability testing methods of non-volatile memory devices
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Дата публикации:
- 30 сентября 2020 г.
- ICS:
- 31.080.01
- Технический комитет:
- CENELEC
- SKU:
- BS EN IEC 60749-41:2020
Abstract
What is BS EN IEC 60749 ‑ 41 about?
BS EN IEC 60749 ‑ 41 is the 41st part of Semiconductor devices in multi-series
BS EN IEC 60749 ‑ 41 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and <span data-mce-fragment="1" data-ccp-props='{"134233279":true,"201341983":0,"335559739":160,"3355...
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