BS EN ISO 9220:1995
Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
- Статус документа:
- Отменён
- Формат:
- Электронный (PDF)
- Дата публикации:
- 29 сентября 1989 г.
- ICS:
- 17.040.20
- Технический комитет:
- CEN
- SKU:
- BS EN ISO 9220:1995
Abstract
1 Scope This International Standard specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-sections with a scanning electron microscope (SEM). It is destructive and has an uncertainty of less than 10 % or 0,1 4m, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a light microscope (ISO 1463) when applicable.
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