BS IEC 60747-18-1:2019

What is BS IEC 60747 ‑ 18 ‑ 1 - Calibration of lens-free CMOS photonic array sensors about?   

BS IEC 60747 is a series of the international standard used for semiconductor devices that have their electrical conductivities lying between that of good conductors and insulators.  
BS IEC 60747 ‑ 18 ‑ 1 is one of the parts of the BS IEC 60747 series of documents that specifies the test methods and data analysis for calibration of lens-free CMOS photonic array sensors.   
BS IEC 60747 ‑ 18 ‑ 1 is useful in measuring and evaluating the parameters for the calibration of lens-free CMOS photonic array sensors that are used in semiconductor devices.  <span data-ccp-props=...