BS IEC 62047-28:2017
Semiconductor devices. Micro-electromechanical devices - Performance testing method of vibration-driven MEMS electret energy harvesting devices
Semiconductor devices. Micro-electromechanical devices - Performance testing method of vibration-driven MEMS electret energy harvesting devices
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Дата публикации:
- 31 июля 2020 г.
- ICS:
- 31.080.99
- Технический комитет:
- CENELEC
- SKU:
- BS IEC 62047-28:2017
Abstract
What is BS IEC 62047 ‑ 28 - Vibration-driven MEMS for energy harvesting devices ?
BS IEC 62047 is an international standard that discusses semiconductor devices including microelectromechanical devices. The main aim of the IEC 62047 series is to provide entities involved with semiconductor technology with best industry techniques to demonstrate the reliability and performance of their devices and components.
BS IEC 62047 ‑ 28 is the 28 th <span...
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