BS IEC 62047-31:2019
Semiconductor devices. Micro-electromechanical devices - Four-point bending test method for interfacial adhesion energy of layered MEMS materials
Semiconductor devices. Micro-electromechanical devices - Four-point bending test method for interfacial adhesion energy of layered MEMS materials
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Дата публикации:
- 30 апреля 2019 г.
- ICS:
- 31.080.99
- SKU:
- BS IEC 62047-31:2019
Abstract
What is BS IEC 62047 ‑ 31 - Micro-electromechanical systems (MEMS) materials about ?
BS IEC 62047 ‑ 31 is the 31st part of an international standard used for semiconductor devices that specifies the bending test method. This test method helps in measuring the interfacial adhesion energy in microelectromechanical devices.
BS IEC 62047-31 is a four-point bending test method for interfacial adhesion energy of layered MEMS materials. BS IEC 62047-31 specifies a four-point bending test method for measuring interfacial adhesion energy of the weakest interface in the layered micro-electromechanical systems (MEMS) based on the concept of fracture mechanics.
Who is BS IEC 62047 ‑ <b data-mce-f...
Похожие стандарты
Упомянутые в описании и другие стандарты BS
IEC 62047-29:2017
ДействующийSemiconductor devices - Micro-electromechanical devices - Part 29: Electromechanical relaxation test method f…
Overview IEC 62047-29:2017 specifies an electromechanical relaxation test method for freestanding conductive thin films under room temperature. The standard defines how to measure time-dependent elec…
IEC 62047-31:2019
ДействующийSemiconductor devices - Micro-electromechanical devices - Part 31: Four-point bending test method for interfa…
Overview IEC 62047-31:2019 specifies a standardized four-point bending test method to measure the interfacial adhesion energy (critical energy release rate) of the weakest interface in layered MEMS m…
BS ISO 10835:2007
ДействующийDirect reduced iron and hot briquetted iron. Sampling and sample preparation.
1 Scope This International Standard gives a) the underlying theory, b) the basic principles for sampling and preparation of samples , and c) the basic requirements for the design, installation and op…