BS IEC 62951-1:2017
Semiconductor devices. Flexible and stretchable semiconductor devices - Bending test method for conductive thin films on flexible substrates
Semiconductor devices. Flexible and stretchable semiconductor devices - Bending test method for conductive thin films on flexible substrates
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Дата публикации:
- 31 мая 2018 г.
- ICS:
- 31.080.99
- SKU:
- BS IEC 62951-1:2017
Abstract
What is BS IEC 62951 ‑ 1 - Flexible and stretchable semiconductor devices about?
BS IEC 62951-1 is an international standard that discusses semiconductor devices for flexible and stretchable semiconductor devices.
BS IEC 62951 ‑ 1 is the first part of the multi-series that specifies a bending test method to measure the electromechanical properties or flexibility of conductive thin films deposited or bonded on flexible non-conductive substrates.
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