BS IEC 63011-1:2018
Integrated circuits. Three dimensional integrated circuits - Terminology
Integrated circuits. Three dimensional integrated circuits - Terminology
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Дата публикации:
- 31 января 2019 г.
- ICS:
- 31.200
- Технический комитет:
- CENELEC
- SKU:
- BS IEC 63011-1:2018
Abstract
What is BS IEC 63011-1 about?
BS IEC 63011-1 is the first part of the BS IEC 63011 series of standards that provides definitions pertaining to multichip integrated circuits, as vertically stacked dies using through-silicon vias (TSVs) or micro bumps. Terms and definitions related to the fabrication and test of the multichip integrated circuits are also provided. BS IEC 63011-1 provides terminology that will help in performing their work which will prevent them from any work hazards.
Who is BS IEC 63011-1 for?
BS IEC 63011-1 on integrated circuits is useful for:
Integrated circuits manufacturers <span data-ccp-props='{"201341983":0,...
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