BS ISO 13067:2011
Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
Название (английский):
BS ISO 13067:2011
Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
- Статус документа:
- Отменён
- Формат:
- Электронный (PDF)
- Дата публикации:
- 30 ноября 2011 г.
- ICS:
- 71.040.50
- SKU:
- BS ISO 13067:2011
Тип поставки:
Язык документа:
Срок поставки:1 рабочий день
Цена:50 €
Abstract
1 Scope This International Standard describes procedures for measuring average grain size derived from a two-dimensional polished cross-section using electron backscatter diffraction (EBSD). This requires the measurement of orientation , misorientation and pattern quality factor as a function of position in the crystalline specimen [1] .
NOTE 1 While conventional methods for grain size determination using optical microscopy are well-established, EBSD methods offer a number of advantages over these techniques, including increased spatial resolution and quantitative description of the orientation of the grains .
NOTE 2 The method also lends itself to the measurement of the grain size of complex materials, for example those with a significant duplex content.
NOTE 3 The reader is warned to interpret the results with care when attempting to investigate specimens with high levels of deformation.
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