BS ISO 29301:2017

1   Scope This document specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope ( TEM ). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica , a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon. This document is applicable to the magnification of the TEM image recorded on a photographic film , or an imaging plate , or detected by an image sensor built into a digital camera . This document also refers to the calibration of a scale bar. This document does not apply to the dedicated critical dimension measurement TEM (CD- TEM ) and the scanning transmission electron microscope (STEM).