IEC 60747-14-2:2000
Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements
Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 14
- Дата публикации:
- 9 ноября 2000 г.
- Издание:
- IEC IS 60747 edition 1 version 1
- ICS:
- 31.080.99
Provides standards for packaged semiconductor Hall elements which utilize the Hall effect.
Abstract
Overview
IEC 60747-14-2:2000 is an International Electrotechnical Commission (IEC) standard that defines requirements for packaged semiconductor Hall elements - devices that sense magnetic fields using the Hall effect. This part of IEC 60747 covers terminology, symbols, essential ratings and characteristics, measuring methods, handling precautions and acceptance criteria for Hall elements packaged as discrete semiconductor devices.
Key topics and technical requirements
- Scope and definitions
- Applies to packaged semiconductor Hall elements that generate an output voltage proportional to magnetic flux density and applied control current or control voltage.
- Key definitions include control current/voltage, offset (residual) voltage, output Hall voltage, input/output resistance, Hall mobility and temperature coefficients.
- Electrical ratings and characteristics
- Limits and specifications for storage/operating temperatures, maximum control current (Ic) and control voltage (Vc).
- Requirement for derating curves: maximum allowable control current/voltage vs. temperature.
- Unloaded characteristics at 25 °C: output Hall voltage, offset voltage, input and output resistance, dielectric strength and dimensional drawings.
- Measuring methods
- Procedures for measuring output Hall voltage (VH), offset voltage (Vo), input resistance (Rin) and output resistance (Rout).
- Measurement circuits for constant-voltage and constant-current biasing; VH = Vout − Vo.
- Principle: VH is proportional to control current (or control voltage) and magnetic flux density (illustrated by VH = (K/d)·Ic·B or equivalent device geometry expressions).
- Measurement precautions: low-ripple DC supplies, proper decoupling, magnetic field uniformity, avoidance of residual fields and accounting for terrestrial magnetism.
- Handling and ESD protection
- Emphasizes electrostatic sensitivity due to thin sensing layers; follow IEC 60747-1 handling rules and IEC 61340-5-1 for ESD protection.
Applications and who uses this standard
- Intended for semiconductor manufacturers, test laboratories, quality and compliance engineers and designers integrating Hall sensors into products.
- Typical application areas: magnetic position and speed sensing, automotive sensors, industrial motion control, consumer electronics and instrumentation where reliable packaged Hall elements are required.
- Useful for product specification, testing protocols, supplier evaluation and ensuring consistent interoperability of Hall sensor components.
Related standards
- IEC 60747-1 - Semiconductor devices: General requirements (this document should be read alongside IEC 60747-14-2).
- IEC 61340-5-1 - Electrostatics: Protection of electronic devices from electrostatic phenomena (ESD handling guidance).
Keywords: IEC 60747-14-2, Hall elements, semiconductor Hall sensor, Hall effect, measuring methods, ESD, sensor specifications, packaged Hall elements.
Технические детали
- Технический комитет
- SC 47E - Discrete semiconductor devices
- SKU
- IEC 60747-14-2:2000
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