IEC 60747-5-11:2019
Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes
Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 13
- Дата публикации:
- 11 декабря 2019 г.
- Издание:
- IEC IS 60747 edition 1 version 1
- ICS:
- 31.080.99
IEC 60747-5-11:2019(E) specifies the measuring methods of radiative and nonradiative currents of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes the internal quantum efficiency (IQE) as a function of current, whose measurement methods are discussed in other documents.
Abstract
Overview
IEC 60747-5-11:2019 is an international standard developed by the International Electrotechnical Commission (IEC) that specifies measurement methods for evaluating radiative and nonradiative currents in single light emitting diode (LED) chips or packages without phosphor. These detailed test methods are essential for characterizing optoelectronic devices, specifically non-phosphor LEDs, and provide vital information for semiconductor manufacturers, test labs, and quality control professionals in the electronics industry.
This standard explicitly excludes white LEDs for lighting applications, focusing solely on non-phosphor LEDs. It employs internal quantum efficiency (IQE) as a core parameter, although IQE measurement methods are covered in other IEC documents. By detailing the approach for measuring both radiative and nonradiative currents, IEC 60747-5-11 assists users in understanding device efficiency and loss mechanisms, paving the way for improved LED performance and reliability.
Key Topics
-
Radiative Current Measurement:
Provides a standardized method to determine the portion of LED current that results in photon emission, using the product of IQE and forward current. -
Nonradiative Current Measurement:
Outlines the calculation of current lost to non-emissive processes, including nonradiative recombination and carrier leakage, obtained by subtracting the radiative current from the total forward current. -
Test Environmental Requirements:
Specifies controlled conditions for temperature (typically 25 ± 3 °C) and relative humidity (45-85% RH) to ensure measurement consistency and repeatability. -
Measurement Sequence:
Describes a step-by-step approach, from initial IQE and voltage measurements through current calculations and reporting, to enable a methodical and accurate test process. -
Test Report Guidelines:
Specifies essential reporting elements including LED maker, model name, chip size, package type, peak wavelength, maximum applied current, environmental conditions, and measurement results for radiative and nonradiative currents.
Applications
IEC 60747-5-11 serves as a reference for various stakeholders involved with LED technology, such as:
-
Semiconductor Device Manufacturers:
Enables standardized evaluation of LED performance during R&D and production, focusing on efficiency and internal loss characterization. -
Quality Control Laboratories:
Provides test protocols that support reliable performance consistency and product qualification. -
Design and Reliability Engineers:
Supplies critical data on nonradiative processes, facilitating design optimizations to reduce losses and extend device lifetimes. -
Academic and Industrial Researchers:
Offers methods for in-depth studies of carrier recombination mechanisms in optoelectronic devices, supporting scientific advancements in semiconductor physics. -
Certification and Compliance Bodies:
Supports conformity assessment and verification processes with globally recognized measurement procedures.
Related Standards
For a comprehensive approach to LED testing and characterization, the following IEC standards are closely related:
-
IEC 60747-5-6:
General specification and performance standards for optoelectronic devices - Light emitting diodes. -
IEC 60747-5-8:
Test method of optoelectronic efficiencies for LEDs. -
IEC 60747-5-9:
Methods to determine internal quantum efficiency using temperature-dependent electroluminescence. -
IEC 60747-5-10:
Methods for measuring internal quantum efficiency based on room-temperature reference points.
These standards collectively support thorough assessment and standardization in the field of semiconductor optoelectronic devices, ensuring high quality and reliability in LED products and measurement protocols.
Adhering to IEC 60747-5-11:2019 guarantees a unified methodology for measuring and reporting the radiative and nonradiative current characteristics of non-phosphor LEDs, essential for advancing semiconductor device innovation and industry-wide consistency.
Технические детали
- Технический комитет
- SC 47E - Discrete semiconductor devices
- SKU
- IEC 60747-5-11:2019
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