IEC 60747-5-4:2022

Overview

IEC 60747-5-4:2022 (with Amendment 1, 2024) is the IEC international standard that defines terminology, essential ratings and characteristics, and measurement methods for semiconductor lasers (optoelectronic devices). It consolidates device definitions, electrical and optical characteristic tables, and standardized test methods so manufacturers, test labs and system integrators can specify, measure and compare laser diodes consistently.

Key topics and requirements

• Terminology and definitions for physical concepts, device types, switching times, output/current parameters, spatial profiles and spectral characteristics. References updated to IEC 60050-845:2020 for lighting-related terms.
• Essential ratings and characteristics such as limiting (absolute maximum) values, electrical and optical characteristics, package and material details, and supplementary information used in datasheets (see Table 1 in Clause 4).
• Measurement methods covering:
  • Power measurement and calibration
  • Output stability: relative intensity noise (RIN), carrier-to-noise ratio (CNR) - corrected equation and measurement precautions added
  • Time-domain behaviour: switching times (rise/fall), small-signal cut-off frequency (f_c) - measurement references harmonized with ISO 11554
  • Lifetime testing and associated reference documents
  • Beam and spectral characteristics: polarization, radiation angle (updated terminology), half-intensity and 1/e2 widths, and spectral linewidth (new in this edition)
• Precautions and updates: amendment corrects CNR equation, adds equipment/arrangement cautions for CNR and beam-width measurements, and revises reference tables in annexes following current ISO publications.

Practical applications

• Create consistent, comparable datasheets and product specifications for semiconductor lasers.
• Define and harmonize test procedures in R&D and production test labs to ensure repeatable measurement of power, noise, modulation bandwidth and beam quality.
• Support qualification and lifetime testing for industrial, telecommunications, sensing/LiDAR, medical and consumer photonics products.
• Aid procurement, certification and compliance programs by providing agreed measurement metrics and limits.

Who should use this standard

• Laser diode and optoelectronic device manufacturers
• Test and calibration laboratories
• Systems and module integrators (telecom, sensing, industrial automation)
• Engineers writing datasheets, specifications or acceptance criteria
• Standards committees and compliance/certification bodies

Related standards

• IEC 60050-845 (International Electrotechnical Vocabulary - lighting terms)
• ISO 11554 (laser modulation/bandwidth measurement methods)
• Other ISO/IEC laser and beam-profile publications referenced in annexes

Using IEC 60747-5-4 ensures clarity and interoperability when specifying and measuring semiconductor laser performance, improving product quality and comparability across suppliers and industries.