IEC 60748-2:1997

Overview

IEC 60748-2:1997 is an international standard published by the International Electrotechnical Commission (IEC) that specifies terminology, characteristics, ratings, and testing guidelines for digital integrated circuits (ICs). This standard is part two of the IEC 60748 series focused exclusively on digital integrated circuits including combinatorial and sequential logic circuits, memories, microprocessors, and charge-transfer devices. It is intended to be used alongside IEC 60747-1 and IEC 60748-1 to ensure comprehensive coverage of semiconductor device standards.

The scope of IEC 60748-2:1997 covers essential aspects for the design, characterization, and testing of digital ICs, with chapters on terminology, electrical and mechanical characteristics, and detailed functional descriptions tailored for different device categories.

Key Topics

• Terminology and Symbols: The standard provides detailed definitions and letter symbols for combinatorial and sequential circuits, integrated circuit memories, microprocessors, and charge-transfer devices. It also includes classifications of programmable logic devices (PLDs) and specific terms related to device limits, latch-up phenomena, and testing.

• Electrical Ratings and Characteristics: IEC 60748-2 specifies static, quasi-static, and dynamic electrical characteristics for both bipolar and MOS digital ICs. This includes voltage and current limits, temperature ranges, and conditions for worst-case scenarios. The standard addresses:

  • Continuous and non-continuous voltage and current limits
  • Latch-up susceptibility and prevention
  • Input/output signal voltage levels and currents
  • Package identification and device technological classifications

• Functional Specifications: Detailed guidelines for functional block diagrams, functional descriptions, and complex circuit structures of digital ICs are provided to standardize device documentation.

• Testing and Measurement: Instructions for typical waveform definitions, test configurations for memory devices, and evaluation of dynamic parameters help manufacturers ensure device compliance and interoperability.

• Handling and Protection: The standard includes recommendations for handling, protection margins against disturbances, and interconnection requirements for digital ICs.

Applications

IEC 60748-2:1997 serves as a critical reference for manufacturers, designers, and engineers involved in:

• Semiconductor Device Manufacturing: Ensuring consistent production of digital integrated circuits with standardized performance benchmarks.
• Digital System Design: Facilitating the development of digital electronics by providing common terminology, electrical characteristics, and well-defined functional requirements.
• Quality Assurance and Testing: Enabling comprehensive testing protocols to verify device reliability, operating limits, and robustness, including susceptibility to latch-up.
• Microprocessor and Memory Development: Assisting in the specification and evaluation of embedded memories and microprocessor functional blocks.
• Programmable Logic Device Classification: Helping to classify and standardize PLDs for improved compatibility and application.

Related Standards

• IEC 60747-1: Semiconductor devices - Integrated circuits - Part 1: Generic specification. It complements IEC 60748-2 by covering general requirements applicable across integrated circuit families.
• IEC 60748-1: Semiconductor devices - Integrated circuits - Part 1: Terminology. Used with part 2 for consistent definition and interpretation of terms in semiconductor device standards.
• IEC 60050: International Electrotechnical Vocabulary, essential for consistent terminology in electrotechnical fields.
• IEC 60027, 60417, 60617: Standards for letter symbols and graphical symbols widely referred in electrical and electronic technology documentation.

Summary

IEC 60748-2:1997 is an authoritative standard central to the development and verification of digital integrated circuits. By defining uniform terminology, detailed electrical and functional characteristics, and test specifications, it enhances the reliability and interoperability of digital ICs worldwide. Industry players rely on this standard to maintain quality, ensure consistent device performance, and accelerate innovation across semiconductor technologies.