IEC 62024-1:2017

Overview

IEC 62024-1:2017 - "High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor" is the third edition (2017) IEC standard that specifies electrical characteristics and standardized measuring methods for nanohenry-range chip inductors used in high-frequency applications (above 100 kHz). This edition updates the 2008 version and includes significant technical changes such as the addition of the voltage‑drop method for DC resistance measurement and the unification of technical terms.

Key topics and technical requirements

• Scope: Defines measurement practices for chip inductors in the nanohenry range intended for high-frequency use (>100 kHz).
• Primary electrical characteristics covered:
  • Inductance - measured using the vector voltage/current method and defined measuring circuits and fixtures.
  • Q‑factor (quality factor) - measurement methods, circuits and mounting considerations.
  • Impedance - measurement techniques and calculation methods.
  • Self‑resonance frequency - covered by methods such as the minimum output method, reflection method, and measurement by impedance/network analyzers.
  • DC resistance (DCR) - includes voltage‑drop method (new in this edition) and the traditional bridge method, plus notes on measuring temperature.
• Test fixtures and mounting: Specifies recommended test fixtures (Fixture A and B), mounting procedures for accurate measurement, and a normative Annex A on mounting methods for surface‑mount coils.
• Measuring circuits and calculation formulas: The standard provides example circuits (vector method, resonance test circuits, voltage‑drop and bridge circuits) and formulas for deriving parameters from measured quantities.
• Normative references: Cross‑references to related materials and standards (e.g., IEC 62025‑1, IEC 61249‑2‑7, ISO 9453).

Practical applications and users

Who uses IEC 62024-1:2017:

• Inductor and passive component manufacturers - to define production test procedures and datasheet specifications.
• Test and calibration laboratories - to perform reproducible electrical measurements and report results.
• RF/telecom and electronics designers - to select and validate chip inductors for filters, matching networks, EMI suppression and other high‑frequency circuits.
• Procurement, quality and compliance teams - to ensure parts meet internationally consistent test methods.

Practical benefits:

• Ensures consistent, comparable measurements across suppliers and labs.
• Reduces design risk by standardizing how inductance, Q, impedance, resonance and DCR are measured for nanohenry chip inductors.

Related standards

• IEC 62024 series (other parts)
• IEC 62025-1 (non‑electrical characteristics for fixed surface‑mounted inductors)
• IEC 61249-2-7, ISO 9453, ISO 6353-3 (referenced material and test method standards)

Keywords: IEC 62024-1:2017, nanohenry range chip inductor, high frequency inductive components, measuring methods, inductance measurement, Q‑factor, self‑resonance frequency, DC resistance voltage‑drop method.