IEC 62047-5:2011
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 69
- Дата публикации:
- 13 июля 2011 г.
- Издание:
- IEC IS 62047 edition 1 version 1
- ICS:
- 31.080.99
IEC 62047-5:2011 describes terminology, definition, symbols, test methods that can be used to evaluate and determine the essential ratings and characteristic parameters of RF MEMS switches. The statements made in this standardization are also applicable to RF (Radio Frequency) MEMS (Micro-Electro-Mechanical Systems) switches with various structures, contacts (d.c. contact and capacitive contact), configurations (series and shunt), switching networks (SPST, SPDT, DPDT, etc.), and actuation mechanism such as electrostatic, electro-thermal, electromagnetic, piezoelectric, etc. The RF MEMS switches are promising devices in advanced mobile phones with multi-band/mode operation, smart radar systems, reconfigurable RF devices and systems, SDR (Software Defined Radio) phones, test equipments, tunable devices and systems, satellite, etc. The contents of the corrigendum of March 2012 have been included in this copy.
Abstract
Overview
IEC 62047-5:2011 establishes international definitions, terminology, symbols, and test methods for evaluating and determining essential ratings and characteristic parameters of RF MEMS (Radio Frequency Micro-Electro-Mechanical Systems) switches. Developed by the International Electrotechnical Commission (IEC), this standard applies to a wide range of RF MEMS switch structures, including both d.c. contact and capacitive contact types, as well as various configurations and actuation mechanisms such as electrostatic, electro-thermal, electromagnetic, and piezoelectric actuation.
RF MEMS switches are integral in advanced electronic applications, offering high isolation, low insertion loss, and innovative reconfigurable RF designs for fields such as communications, radar, and satellite systems. IEC 62047-5:2011 provides a reliable foundation for manufacturers, test engineers, and users to specify, compare, and validate these cutting-edge semiconductor devices.
Key Topics
- Terminology and Definitions: Clear and standardized terms for RF MEMS switches, including classifications by operation (capacitive or d.c. contact), configurations (series, shunt), and actuation mechanisms.
- Switching Network Configurations: Covers single-pole-single-throw (SPST), single-pole-double-throw (SPDT), double-pole-double-throw (DPDT), and more complex multi-pole, multi-throw types, supporting diverse circuit architectures.
- Essential Ratings and Characteristics: Guidance for identifying and specifying operational details, including actuation voltage, power handling, on/off resistance and capacitance, insertion loss, isolation, return loss, and switching time.
- Test Methods: Prescribes methods and setups for measuring DC and RF characteristics, such as actuation voltage, on/off resistance, capacitance, power consumption, insertion loss, and reliability/performance tests (life cycles, environmental stress).
- Reliability and Performance: Detailed lifetime testing protocols, including cold and hot switching conditions, temperature cycling, humidity, shock, vibration, and ESD sensitivity.
Applications
RF MEMS switches offer substantial performance benefits in a wide range of high-frequency and reconfigurable electronic applications. According to IEC 62047-5:2011, practical applications include:
- Mobile Devices: Advanced multi-band and multi-mode smartphones and software-defined radio (SDR) phones, enabling dynamic RF path selection and improved efficiency.
- Radar Systems: Key switching components in smart, adaptive, and reconfigurable radar architectures, where high reliability and precise switching are critical.
- Test Equipment: High-frequency test equipment and instrumentation, benefiting from accurate, repeatable switching performance over many cycles.
- Satellite and Aerospace: Use in tunable systems and satellite RF chains, where low power consumption, high isolation, and minimal insertion loss are essential.
- Research and Development: Reference standard for developing, designing, and qualifying new RF MEMS technologies and integrating them into next-generation electronic products.
Related Standards
Users of IEC 62047-5:2011 may also need to consult related international standards to ensure comprehensive evaluation and compliance of RF MEMS switches. Notable references include:
- IEC 60747-1: Semiconductor devices - General
- IEC 60747-16-1: Microwave integrated circuits - Amplifiers
- IEC 60747-16-4: Microwave integrated circuits - Switches
- IEC 60749-5: Mechanical and climatic test methods - Steady-state temperature humidity bias life test
- IEC 60749-10: Mechanical shock test methods
- IEC 60749-12: Vibration, variable frequency test methods
- IEC 60749-27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
By following IEC 62047-5:2011, organizations ensure consistent evaluation, increased reliability, and improved interoperability in RF MEMS switch design and application. This international guidance supports rapid innovation and robust, standards-based solutions in today’s high-frequency electronics ecosystem.
Технические детали
- Технический комитет
- SC 47F - Micro-electromechanical systems
- SKU
- IEC 62047-5:2011
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