IEC 62258-2:2011
Semiconductor die products - Part 2: Exchange data formats
Semiconductor die products - Part 2: Exchange data formats
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 141
- Дата публикации:
- 25 мая 2011 г.
- Издание:
- IEC IS 62258 edition 2 version 1
- ICS:
- 11.040.50
IEC 62258-2:2011 specifies the data formats that may be used for the exchange of data which is covered by other parts of the IEC 62258 series, as well as definitions of all parameters used according to the principles and methods of IEC 61360. It introduces a Device Data Exchange (DDX) format, with the prime goal of facilitating the transfer of adequate geometric data between die manufacturer and CAD/CAE user and formal information models that allow data exchange in other formats such as STEP physical file format, in accordance with ISO 10303-21, and XML. The data format has been kept intentionally flexible to permit usage beyond this initial scope. It has been developed to facilitate the production, supply and use of semiconductor die products, including but not limited to wafers, singulated bare die, die and wafers with attached connection structures, minimally or partially encapsulated die and wafers. This standard reflects the DDX data format at version 1.3.0. With respect to the first edition, several parameters have been updated for this edition. This publication is to be read in conjunction with IEC 62258-1:2009.
Abstract
Overview
IEC 62258-2:2011 is an international standard developed by the International Electrotechnical Commission (IEC) that specifies the exchange data formats for semiconductor die products. It forms part 2 of the IEC 62258 series and introduces a Device Data Exchange (DDX) format designed to facilitate the transfer of detailed geometric and device information between semiconductor die manufacturers and CAD/CAE users. This standard supports the production, supply, and utilisation of diverse semiconductor die products, such as wafers, singulated bare die, dies with connection structures, and partially encapsulated devices.
IEC 62258-2:2011 outlines flexible and extensible data formats that support exchange in multiple file formats including the STEP physical file format (ISO 10303-21) and XML, ensuring interoperability across diverse design and manufacturing environments. The standard reflects version 1.3.0 of the DDX data format with updates to several parameters to improve accuracy and usability.
Key Topics
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Device Data Exchange (DDX) Format: A core element of the standard facilitating comprehensive data exchange of geometric and device details, optimized for interoperability between semiconductor manufacturers and CAD/CAE systems.
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Data Format Flexibility: Supports multiple formal information models and file formats, including STEP and XML, accommodating evolving technology and diverse industry needs.
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Geometric Data Representation: Defines precise geometric parameters and coordinate systems to model dies, wafers, and associated structures, with provisions for units, tolerances, and orientation.
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Comprehensive Device Parameters: Includes detailed fields covering device identification, manufacturing data, material specifications, electrical and thermal ratings, wafer specifics, and packaging information.
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Handling and Storage Data: Parameters addressing delivery form, packing codes, assembly, and quality testing essential for supply chain and manufacturing process management.
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Compatibility and Referencing: Designed to align with IEC 61360 principles and methods, ensuring standardized definitions and parameter consistency.
Applications
IEC 62258-2:2011 is critical for semiconductor manufacturers, design engineers, and system integrators involved in:
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Semiconductor Design and Manufacturing: Efficiently exchanging geometric and functional data for wafers, die, and minimally packaged devices to streamline production workflows.
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CAD and CAE Integration: Enabling seamless transfer of semiconductor die data into computer-aided design and engineering tools, enhancing accuracy in simulation, modelling, and assembly planning.
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Supply Chain Coordination: Sharing standardized device and handling data between suppliers and users, improving traceability, quality control, and inventory management.
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Quality and Reliability Assessment: Providing test and quality parameters in standardized format to facilitate product validation and compliance verification.
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Simulation and Modelling: Including support for simulator-specific parameters, model files, and compliance details to enhance electronic and thermal simulation capabilities.
Related Standards
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IEC 62258-1:2009: Part 1 of the semiconductor die products series, providing foundational concepts that complement the exchange format specifications in IEC 62258-2.
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IEC 61360 Series: Defines the principles and methods for specifying parameters and vocabulary used within IEC 62258-2, ensuring uniform terminology and parameter handling.
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ISO 10303-21 (STEP Physical File Format): Supported by IEC 62258-2 for geometric data exchange, facilitating interoperability within product data management and CAD systems.
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Other IEC 62258 Parts: Cover related topics in semiconductor die products that collectively support comprehensive device data management and exchange.
IEC 62258-2:2011 offers an essential framework for establishing consistent, interoperable data formats crucial for modern semiconductor manufacturing and design processes. Adopting this standard ensures effective communication, reduces errors in data exchange, and supports advanced semiconductor technologies and CAD/CAE tool integration. For organizations in the semiconductor industry, leveraging IEC 62258-2 enhances supply chain efficiency, design accuracy, and product quality management.
Технические детали
- Технический комитет
- TC 47 - Semiconductor devices
- SKU
- IEC 62258-2:2011
Похожие стандарты
Стандарты, упомянутые в описании
IEC 62258-1:2009
ДействующийSemiconductor die products - Part 1: Procurement and use
Overview IEC 62258-1:2009 is an international standard developed by the International Electrotechnical Commission (IEC) that provides guidelines for the procurement and utilization of semiconductor d…