IEC 62899-203:2024
Printed electronics - Part 203: Materials - Semiconductor ink
Printed electronics - Part 203: Materials - Semiconductor ink
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 23
- Дата публикации:
- 28 мая 2024 г.
- Издание:
- IEC IS 62899 edition 2 version 1
- ICS:
- 29.045
IEC 62899-203:2024 defines terms and specifies standard methods for characterization and evaluation of semiconductor inks and semiconductive layers that are made from semiconductor inks. This edition includes the following significant technical changes with respect to the previous edition: a) addition of 6.3.1.2.2 - Normalised on-current measurement of the TFT device; b) in 6.3.2, correction of formula for calculation of permittivity.
Abstract
Overview
IEC 62899-203:2024 - Printed electronics: Materials - Semiconductor ink is the 2024 second edition of the IEC method standard for characterizing semiconductor inks and the semiconductive layers produced from them. The document defines key terms and specifies standardized test methods covering formulation parameters, physical ink properties, electrical and optical properties of printed semiconductive films, and storage/ageing evaluation. This edition additionally introduces a normalised on-current measurement for TFT devices and corrects the permittivity calculation in the dielectric test methods.
Key topics and technical requirements
The standard organizes evaluation into clear, repeatable test areas (summarized from the contents):
- Terms and definitions: standardized vocabulary for semiconductor ink testing to ensure consistent reporting.
- Atmospheric conditioning: specified atmospheres for conditioning and testing to improve comparability.
- Ink composition & contents:
- Solid content and non‑volatile content measurement methods.
- Physical properties of inks:
- Density, rheology (viscosity), surface tension, flash point and evaporation rate-methods referenced to established ISO tests.
- Semiconductive layer evaluation:
- Test-piece preparation (substrates, layer dimensions, deposition).
- Electrical properties: charge mobility, dielectric properties (including corrected permittivity formula), ionization potential and band-gap measurements.
- Device-level measurement: TFT-related tests including the newly added normalised on-current method (6.3.1.2.2) to improve device comparability.
- Optical properties: luminous transmittance, chromaticity, colour uniformity, haze and refractive index.
- Storage and ageing: storage conditions and methods for quantifying deterioration caused by ageing, with informative annex examples.
Practical applications and users
IEC 62899-203:2024 is intended for stakeholders involved in printed electronics material development and quality control:
- Semiconductor ink manufacturers - standardize characterization and supply specifications.
- Device manufacturers & OEMs - validate inks for printed transistors, sensors, displays and flexible electronics.
- Test laboratories and QA teams - implement repeatable methods for acceptance testing and R&D benchmarking.
- Research institutions - compare materials and processing effects using standardized metrics.
- Supply chain and procurement - specify standardized test requirements in contracts and datasheets.
Adopting IEC 62899-203 helps reduce ambiguity in material specifications, improves interoperability across suppliers and fabs, and supports reproducible device performance benchmarking.
Related standards and references
- IEC 62899 series (Parts 1, 201, 202, etc.) - overarching printed electronics material and equipment standards.
- IEC 62860 - test methods for characterization of organic transistors and materials.
- Various ISO methods referenced for physical and optical measurements.
For the official text, test procedures and normative references consult the IEC Webstore (webstore.iec.ch).
Технические детали
- Технический комитет
- TC 119 - Printed Electronics
- SKU
- IEC 62899-203:2024
Похожие стандарты
Стандарты, упомянутые в описании
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