ISO 14975:2000
Surface chemical analysis — Information formats
Surface chemical analysis — Information formats
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 17
- Дата публикации:
- 7 декабря 2000 г.
- Издание:
- ISO IS 14975 edition 1 version 1
- ICS:
- 35.240.70
This International Standard specifies a format to supplement ISO 14976 to transfer data for the creation, expansion and revision of a surface chemical analysis spectral database. The format is applied to Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) spectral data.
Abstract
Overview - ISO 14975:2000 (Surface chemical analysis - Information formats)
ISO 14975:2000 defines a structured text format to supplement for transferring metadata needed to create, expand and revise a surface chemical analysis spectral database. The standard is explicitly applied to Auger electron spectroscopy (AES) and X‑ray photoelectron spectroscopy (XPS) spectral data. It prescribes machine‑readable “information packages” that can be embedded in the data transfer format (DTF) comment lines or attached alongside DTF files so existing DTF readers remain compatible.
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