ISO 16526-2:2011
Non-destructive testing — Measurement and evaluation of the X-ray tube voltage — Part 2: Constancy check by the thick filter method
Non-destructive testing — Measurement and evaluation of the X-ray tube voltage — Part 2: Constancy check by the thick filter method
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 5
- Дата публикации:
- 15 декабря 2011 г.
- Издание:
- ISO IS 16526 edition 1 version 1
- ICS:
- 19.100
ISO 16526-2:2011 specifies a constancy check of a X-ray system where mainly the X-ray voltage is checked and also the tube current and the constitution of the target which can be changing due to ageing of the tube. The thick filter method is based on a measurement of the dose rate behind a defined thick filter using defined distances between the X-ray tube, the filter and the measuring device. This method is very sensitive to changes of the voltage, but it does not provide an absolute value for the X-ray tube voltage. Therefore, a reference value is needed and, it is recommended to find this reference, for example, within the acceptance test of the system. The thick filter method is a rather simple technique and may be applied by the operator of an X-ray system to perform regularly a constancy check of the system. The method can also be applied for consistency checks after changing components which may affect the X-ray tube voltage. This method can be applied for all types of X-ray systems, i. e. for constant potential, half wave and impulse wave generators with a tube current larger than 1 mA.
Abstract
Overview
ISO 16526-2:2011 specifies a practical constancy check for X‑ray systems - the thick filter method - used in non‑destructive testing (NDT) to monitor changes in the X‑ray tube voltage, tube current and target condition (ageing). The method measures the dose rate behind a defined thick filter at fixed distances between X‑ray tube, filter and dose meter. It is highly sensitive to voltage changes but does not provide an absolute kV value; a reference value (typically from the system acceptance test) is required for comparison.
Key topics and technical requirements
- Purpose: regular constancy checks and post‑component‑change consistency checks for X‑ray systems.
- Applicability: constant potential, half‑wave and impulse‑wave generators with tube current > 1 mA.
- Equipment and setup:
- X‑ray system, specified collimator, thick filter, suitable dose meter / dose‑rate meter, film for collimation proof.
- Fixed focus‑to‑filter and focus‑to‑meter distances for the reference and all subsequent tests.
- Collimator diameter as small as possible; homogeneous irradiation area at the detector ≤ 3× detector chamber size (verified by film).
- Measurement control:
- Determine the leverage factor (L) for the chosen setup by measuring dose at 100% and 95% of the test voltage. A leverage factor between about 6 and 8 is recommended for good sensitivity.
- Select exposure time to yield readings between 50% and 100% of meter scale; take three or more measurements and average.
- Dose meter long‑term stability should be at least 3× better than the required tolerance; regular stability checks (e.g., with a radioactive source) are required.
- Result evaluation and documentation:
- Constancy is confirmed if the measured dose/dose‑rate reproduces within the calculated tolerance (derived using the measured leverage factor).
- Test report must document system ID, X‑ray parameters, collimator and filter details, distances, meter ID, measured values, leverage factor, deviation from reference, date and operator signature.
Applications and users
- Intended for operators and maintenance personnel of industrial X‑ray inspection systems who need a simple, repeatable routine check of voltage stability.
- Useful in manufacturing, weld inspection, aerospace, petrochemical and service labs for:
- Periodic stability monitoring
- Verification after repairs or component changes that may affect tube voltage
- Operator-level constancy checks between formal calibrations
Related standards
- ISO 16526-1: Voltage divider method (absolute measurement for constant potential systems)
- ISO 16526-3: Spectrometric method (non‑invasive energy‑spectrum based measurement)
Keywords: ISO 16526-2:2011, thick filter method, X‑ray tube voltage measurement, constancy check, NDT, dose rate, leverage factor, dose meter, collimator.
Технические детали
- Технический комитет
- ISO/TC 135/SC 5 - Radiographic testing
- SKU
- ISO 16526-2:2011
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