ISO 17901-1:2015
Optics and photonics — Holography — Part 1: Methods of measuring diffraction efficiency and associated optical characteristics of holograms
Optics and photonics — Holography — Part 1: Methods of measuring diffraction efficiency and associated optical characteristics of holograms
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 14
- Дата публикации:
- 29 июня 2015 г.
- Издание:
- ISO IS 17901 edition 1 version 1
- ICS:
- 31.020
ISO 17901-1:2015 specifies the terms related to optical characteristics of holograms, the method to measure their diffraction efficiency, and the angular and wavelength selectivity measurement methods. These measurement methods are applicable to any type of hologram if the hologram yields a simple diffraction pattern, which means the reconstructed wave can be clearly separated from other diffracted and non-diffracted waves. In other words, holograms that yield complex diffraction patterns are excluded. There are no restrictions on the materials used to form the holograms.
Abstract
Overview
ISO 17901-1:2015 - Optics and photonics - Holography - Part 1 defines standardized methods for measuring diffraction efficiency and associated optical characteristics of holograms. It establishes terms, coordinate conventions and measurement principles for holograms that yield a simple diffraction pattern (reconstructed waves clearly separable from other diffracted/non‑diffracted waves). The standard is material‑agnostic (no restriction on hologram recording materials) and is the basis for consistent, comparable optical characterization of holograms.
Key topics and technical requirements
- Scope and definitions: precise terms for holograms, object/reference/illuminating/reconstructed waves, transmission/reflection/volume/surface‑relief holograms, Q‑value, diffraction efficiency, angular and wavelength selectivity.
- Measurement principles: defines absolute and relative diffraction efficiency measurements, and measurement of angular selectivity and wavelength selectivity as functions of incidence angle and wavelength.
- Coordinate system: hologram plane = xy, z axis normal to plane; sign conventions for incident and reconstructed waves.
- Measurement environment: dark room, room temperature, stable relative humidity, and control of stray light.
- Required instrumentation:
- Light source with high temporal stability (example: ±5% or better over 30 min for lasers).
- Mirrors with surface accuracy (example: better than 1/10 wavelength).
- Calibrated detectors with appropriate dynamic range.
- Monochromator with ~1 nm spectral resolution or better.
- Integrating sphere (high‑reflectance inner coating; barium sulfate as typical coating).
- Measurement methods covered: absolute diffraction efficiency, relative diffraction efficiency, spectral diffraction efficiency by transmittance (volume holograms), spectral diffraction efficiency by reflectance (volume holograms), angular selectivity, wavelength selectivity.
- Reporting: standardized description of measurement results and conditions to ensure repeatability and traceability.
Applications and who uses this standard
ISO 17901-1 is practical for:
- Hologram manufacturers and quality control labs (display, AR/VR optics, diffraction elements).
- Optical engineers and R&D teams developing holographic optical elements.
- Security printing and anti‑counterfeiting specialists validating holographic features.
- Metrology and test laboratories seeking reproducible measurements and inter‑laboratory comparability. Benefits include consistent performance metrics, reliable comparison between products/processes, and clear test-reporting requirements.
Related standards
- ISO 17901-2: Methods for measurement of hologram recording characteristics (companion document).
- ISO 15902: Diffractive optics - Vocabulary (normative reference used for terms).
Keywords: ISO 17901-1, holography standard, diffraction efficiency measurement, angular selectivity, wavelength selectivity, optics and photonics, hologram testing, measurement methods.
Технические детали
- Технический комитет
- ISO/TC 172/SC 9 - Laser and electro-optical systems
- SKU
- ISO 17901-1:2015
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