ISO 18115-2:2021

Overview

ISO 18115-2:2021 - Surface chemical analysis - Vocabulary - Part 2: Terms used in scanning-probe microscopy - is the ISO vocabulary standard that defines and clarifies terminology used for surface chemical analysis by scanning probe microscopy (SPM). This third edition (2021) is a minor revision of the 2013 edition and updates several terms (for example, replacing “Kelvin‑force microscopy” with Kelvin‑probe force microscopy). The document is prepared by ISO/TC 201/SC 1 and focuses on consistent, internationally agreed definitions to avoid ambiguity across disciplines.

Key topics

• Scope and purpose: Provides standardized terms and definitions specifically for SPM methods used in surface chemical analysis. It complements ISO 18115‑1, which covers general terms and spectroscopy.
• Structured vocabulary: Terms are organized into Clauses covering:
  • SPM methods (Clause 3)
  • Contact mechanics models (Clause 4)
  • Scanning probe method terminology (Clause 5)
  • Supplementary SPM methods (Clause 6)
  • Supplementary terms for SPM (Clause 7)
• Examples of defined techniques and modes (vocabulary entries include AFM-related modes and SPM variants): AFM, NC‑AFM (non‑contact AFM), DFM/FM‑AFM (dynamic/frequency modulation), CPAFM (conductive‑probe AFM), KPFM (Kelvin‑probe force microscopy), MFM (magnetic‑force microscopy), NSOM/SNOM, MRFM, CITS, chemical‑force microscopy, photothermal micro‑spectroscopy (PTMS), and others.
• Ancillary content: Annex A lists abbreviated terms; an informative bibliography points to related literature. The standard contains no normative references.
• Terminology decisions: Notes clarify instrument vs. method usage (e.g., final “M” or “S” in acronyms may mean “microscopy/microscope” or “spectroscopy/spectrometer” depending on context).

Applications and users

Who benefits from ISO 18115‑2:

• Materials scientists, surface chemists, physicists working with AFM/STM/NSOM and other SPM techniques.
• Laboratory managers and instrument manufacturers who need consistent terminology for specifications, user manuals, and data reporting.
• Standards writers, educators, and technical authors preparing documentation, protocols, or training materials.
• Cross-disciplinary teams that require clear communication when exchanging surface analysis data.

Practical value:

• Ensures consistent naming and definitions across reports, papers, and instrument documentation.
• Reduces misunderstandings in method selection, data interpretation, and interlaboratory communication.
• Supports compliance, quality assurance, and traceable documentation in surface chemical analysis workflows.

Related standards

• ISO 18115‑1 (general vocabulary and spectroscopy terms) - complementary.
• Profilometry and surface texture standards mentioned in the introduction: ISO 3274, ISO 4287, ISO 25178 (for users needing deeper guidance on profile and texture measurement).

Keywords: ISO 18115-2, surface chemical analysis, scanning probe microscopy vocabulary, AFM terminology, SPM terms, Kelvin‑probe force microscopy, atomic force microscopy definitions.