Name: ASTM F399-00a — Standard Test Method for Thickness of Heteroepitaxial or Polysilicon Layers (Withdrawn 2002)
SKU: ASTM F399-00a
Price: 1800 RUB
Availability: InStock

ScopeThis standard was transferred to SEMI (www.semi.org) May 20031.1 This test method covers the determination of thickness of silicon heteroepitaxial or polysilicon layers deposited under conditions such that the interface region between ...

ASTM F399-00a

Abstract

Похожие стандарты

ASTM-TPT-47

Phase I & Phase II Environmental Site Assessment Processes

ASTM-TPT-8

Phase I Environmental Site Assessment Practices For Commercial Real Estate: Phase I Site Assessment & Transac…

ASTM-TPT-1137

ASTM D975 Standard Specification for Diesel Fuel

ASTM-TPT-1202

ASTM D8421 Standard Test Method for Determination of Per- and Polyfluoroalkyl Substances (PFAS) in Aqueous Ma…

ASTM-TPT-691

Microaprendizagem para D4057: Amostragem de ponto (PT)

ASTM-TPT-1091

Metodo de prueba estandar D4052 de ASTM -- Curso de aprendizaje electrónico (ES)

ASTM ACEM20180086

Using Neutron Radiography to Quantify the Settlement of Fresh Concrete

ASTM ACEM20180041

Experimental Study of Competing Failure of Reinforced Concrete Based on the Weibull Distribution