Name: ASTM F613-93 — Test Method for Measuring Diameter of Semiconductor Wafers (Withdrawn 2001)
SKU: ASTM F613-93
Price: 1800 RUB
Availability: InStock

Scope1.1 This test method covers measurement of the diameter of silicon wafers up to 205 mm in diameter. Other semiconductor materials with a circular shape can also be measured. 1.2 This test method is independent of surface finish and may...

ASTM F613-93

Abstract

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