BS IEC 62951-6:2019
Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films
Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Дата публикации:
- 31 мая 2019 г.
- ICS:
- 31.080.99
- SKU:
- BS IEC 62951-6:2019
Abstract
What is BS IEC 62951 ‑ 6 - Semiconductor devices about?
BS IEC 62951-6 is the sixth part of an International Standard used for Semiconductor devices. BS IEC 62951-6 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.
Who is BS IEC 62951-6 - Semiconductor devices for?
BS IEC 62951-6 Semiconductor devices are beneficial for:
Semiconductor foundries
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