BS ISO 14701:2018

Name: BS ISO 14701:2018 — Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness.
SKU: BS ISO 14701:2018
Price: 46800 RUB
Availability: InStock

Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness.

Название (английский):

BS ISO 14701:2018

Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness.

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 26
Дата публикации:: 5 ноября 2018 г.
SKU:: BS ISO 14701:2018

Тип поставки:

Full version46 800 ₽Read online 24h1 200 ₽Read online 72h1 800 ₽

Язык документа:

ruen

Срок поставки:5 раб. дн. (перевод)

Цена:46 800 ₽

BS ISO 14701:2018

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