IEC 60512-25-3:2001
Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c - Rise time degradation
Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c - Rise time degradation
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 23
- Дата публикации:
- 26 июля 2001 г.
- Издание:
- IEC IS 60512 edition 1 version 1
- ICS:
- 31.220.10
Describes a method for measuring the effect a specimen has on the rise time of a signal passing through it.
Abstract
Overview
IEC 60512-25-3:2001 is an international standard developed by the International Electrotechnical Commission (IEC). It focuses on connectors for electronic equipment, specifically detailing Test 25c, which measures rise time degradation. This standard specifies a method to evaluate the effect a connector specimen has on the rise time of an electrical signal passing through it. Rise time degradation is a critical parameter in high-speed electronic systems, affecting signal integrity and overall performance.
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