IEC 60749-43:2017
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
- Статус документа:
- D
- Формат:
- Электронный (PDF)
- Количество страниц:
- 74
- Дата публикации:
- 15 июня 2017 г.
- Издание:
- IEC IS 60749 edition 1 version 1
- ICS:
- 31.080.01
IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.
Технические детали
- Технический комитет
- TC 47 - Semiconductor devices
- SKU
- IEC 60749-43:2017
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