IEC 61445:2012
Digital Test Interchange Format (DTIF)
Digital Test Interchange Format (DTIF)
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 101
- Дата публикации:
- 21 июня 2012 г.
- Издание:
- IEEE IS 61445 edition 1 version 1
- ICS:
- 25.040.01
IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following: a) UUT Model; b) Stimulus and Response; c) Fault Dictionary; d) Probe.
Abstract
Overview
defines the information content and data formats used to interchange digital test program data between and for board‑level printed circuit assemblies (PCBs). The standard (IEC/IEEE dual‑logo, based on IEEE Std 1445‑1998) focuses on structuring the test-related data needed for generation, execution and diagnostic use of digital test programs.
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