IEC 61967-4:2002

Overview

IEC 61967-4:2002 is an international standard developed by the International Electrotechnical Commission (IEC) for evaluating the electromagnetic emissions of integrated circuits (ICs) in the frequency range of 150 kHz to 1 GHz. Specifically, Part 4 of this series details the measurement of conducted emissions using the 1 ohm/150 ohm direct coupling method. This standard specifies procedures for directly measuring radio-frequency (RF) currents with a 1 ohm resistive probe and RF voltages using a 150 ohm coupling network, ensuring highly repeatable and correlated results. The latest consolidated version includes modifications from Amendment 1:2006 and the corrigendum of June 2017.

Key Topics

• Conducted Emission Measurement Methods: The standard outlines two main approaches for measuring conducted electromagnetic emissions from ICs:

  • Direct RF current measurement using a 1 ohm resistive probe
  • RF voltage measurement via a 150 ohm direct coupling network

• Test Environment and Equipment:

  • Requirements for RF current probes and voltage coupling networks
  • Specifications for test receivers and supporting instrumentation
  • Guidance on test board layout and general test configurations to maximize repeatability

• Repeatability and Correlation: The document emphasizes the importance of establishing standardized procedures that yield consistent, comparable results across different laboratories and measurement setups.

• Measurement Frequency Range: Focused on IC emissions from 150 kHz to 1 GHz, addressing both low and high-frequency disturbances relevant for EMC compliance.

• Test Reporting: Standardizes the format and critical content required in test reports for comparison and regulatory purposes.

Applications

• Semiconductor Manufacturers: Ensuring compliance with electromagnetic compatibility (EMC) requirements during IC design and validation.

• EMC Testing and Certification: Providing testing laboratories with a proven, replicable method to measure and document conducted emissions, essential for product certification and market approval.

• Automotive and Industrial Electronics: Used in sectors where conducted emissions standards are mandatory, such as automotive ECUs and industrial control modules, to meet strict EMC regulations.

• Research and Development: Assists engineers and researchers in benchmarking the conducted emission performance of new IC designs or system-level prototypes.

Related Standards

• IEC 61967-1: Integrated circuits - General conditions and definitions for measurement methods. Provides general guidelines and definitions applicable to all parts in the IEC 61967 series.

• IEC 61000-4-6: Electromagnetic compatibility (EMC) - Immunity to conducted disturbances induced by radio-frequency fields. Guides the immunity testing environment relevant to the emissions measured in IEC 61967-4.

• CISPR 16 Series: Specifications for radio disturbance and immunity measuring apparatus and methods. Key references for receiver and measurement system requirements.

• Other IEC 61967 Parts:

  • Part 2: Measurement of radiated emissions - TEM cell method
  • Part 3: Surface scan method for radiated emissions
  • Part 5: Workbench Faraday cage method for conducted emissions
  • Part 6: Magnetic probe method for conducted emissions

Practical Value

Implementing IEC 61967-4 enables organizations to:

• Compare conducted emission results reliably across different test sites
• Streamline the compliance process for ICs used in sensitive applications
• Reduce EMC-related issues during product development and after deployment
• Demonstrate adherence to international EMC standards, supporting global market access

By following the standardized test methods in IEC 61967-4, manufacturers and testing labs can ensure their integrated circuits meet electromagnetic emission performance requirements, supporting product quality and regulatory success.