Overview
IEC 62884-2:2017 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators: Part 2: Phase jitter measurement method - defines standard methods to measure and evaluate phase jitter of oscillators (including crystal, dielectric resonator oscillators (DROs) and FBAR-based oscillators). The standard prescribes using phase noise measurement equipment or a phase-noise measurement system and gives guidance to obtain accurate RMS jitter values and other jitter metrics.
Key topics
- Scope and targets
- Measurement procedures specifically for piezoelectric, dielectric and electrostatic oscillators, with guidance for DROs and thin-film bulk acoustic resonator (FBAR) oscillators.
- Measurement domains
- Procedures for measuring phase jitter in the time domain, data domain, and frequency domain (phase-noise-based methods).
- Equipment and setup
- Use of phase noise analyzers, sampling oscilloscopes, and jitter/wander analysers (e.g., block diagrams referenced to ITU-T practices).
- Requirements on input/output impedances, output waveform, output voltage, and jitter floor of measurement systems.
- Test procedures and environment
- Pre-test setup and configuration, measurement under reference temperature, temperature-characteristics testing, measurement under vibration, impact, and accelerated ageing.
- Calculation and analysis
- Normative Annex A: calculation methods linking phase noise (SSB phase noise) to phase jitter metrics - RMS jitter, peak-to-peak, random vs deterministic jitter, and total jitter.
- Measurement integrity
- Guidance on test fixtures, cables, instruments, error sources, and factors affecting measurement uncertainty.
- Document structure
- Normative references and terminology aligned with related IEC and ISO vocabularies.
Applications
IEC 62884-2:2017 is useful for:
- Oscillator manufacturers validating phase jitter performance for product datasheets and customer delivery.
- Test laboratories standardizing measurement procedures and reporting reproducible RMS jitter and phase-noise-derived metrics.
- RF and system engineers designing communications, satellite, automotive, EV control and timing systems where low jitter/phase noise is critical.
- Quality and compliance teams performing environmental and ageing tests (temperature, vibration, impact, accelerated ageing) to assess long-term oscillator stability.
Related standards
Keywords: IEC 62884-2:2017, phase jitter measurement, phase noise, oscillator testing, DRO, FBAR, RMS jitter, jitter measurement methods.