IEC TR 62878-2-2:2015
Device embedded substrate - Part 2-2: Guidelines - Electrical testing
Device embedded substrate - Part 2-2: Guidelines - Electrical testing
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 29
- Дата публикации:
- 4 декабря 2015 г.
- Издание:
- IEC TR 62878 edition 1 version 1
- ICS:
- 31.180
IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.
Abstract
Overview
IEC TR 62878-2-2:2015 is a technical report published by the International Electrotechnical Commission (IEC) that provides comprehensive guidelines for electrical testing of device embedded substrates. Device embedded substrates are advanced materials used in electronics manufacturing where active or passive devices are integrated directly within the substrate itself. This standard outlines required electrical tests, such as interconnection open-circuit and short-circuit checks, as well as functional testing of embedded devices. By establishing a structured approach to electrical testing, IEC TR 62878-2-2 helps ensure performance, reliability, and quality for substrates with embedded components in complex electronic assemblies.
Похожие стандарты
Упомянутые в описании и другие стандарты IEC