IEC TR 63571:2025
Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”
Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 24
- Дата публикации:
- 13 мая 2025 г.
- Издание:
- IEC TR 63571 edition 1 version 1
- ICS:
- 31.080.99
IEC TR 63571:2025 describes a method to calculate “SYSTEM”-level lifetime from “PART”-level lifetime. It presents a general mathematical theory and simple calculation examples for educational purposes. Of the elements related to “SYSTEM”-level lifetime, software-related elements such as diagnostics are outside the scope of this document.
Abstract
Overview
is an IEC Technical Report (Edition 1.0, 2025‑05) that defines a mathematical method to convert component‑level (“PART”) lifetime data into device‑ or product‑level (“SYSTEM”) lifetime estimates. The report targets semiconductor reliability assessment during wafer/TEG (test element group) development and LSI design, presenting a general theory plus simple calculation examples for educational use. Note: software‑related elements (for example diagnostics) are explicitly outside the scope.
Похожие стандарты
Другие стандарты IEC