IEC/TS 62607-2-1:2012
Nanomanufacturing - key control characteristics for CNT film applications - Resistivity — Part 2-1:
Nanomanufacturing - key control characteristics for CNT film applications - Resistivity — Part 2-1:
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 11
- Дата публикации:
- 22 мая 2015 г.
- Издание:
- IEC TS 62607 edition 1 version 1
- ICS:
- 07.030
This part of IEC 62607 provides a standardized method for categorizing a grade of commercial CNTs in terms of their electrical properties to enable a user to select a CNT material suitable for their application. The method is intended to assess whether the delivered materials from different production batches of the same production process are comparable regarding electrical properties of the final product which are related to electrical conductivity. The correlation between the measured parameters by the proposed method and a relevant product performance parameter has to be established for every application. This specification includes a) definitions of terminology used in this document, b) recommendations for sample preparation, c) outlines of the experimental procedures to measure sheet resistance of CNTs in thin films, d) methods of interpretation of results and discussion of data analysis, e) case studies and, f) references.
Abstract
Overview
IEC/TS 62607-2-1:2012 - Nanomanufacturing: Carbon nanotube materials - Film resistance - provides a standardized, repeatable method to categorize commercial carbon nanotube (CNT) grades by their electrical properties. Published as an IEC Technical Specification (TC 113), it focuses on measuring and interpreting sheet resistance of CNT thin films (SWCNT and MWCNT) so users can select materials and compare production batches for electrical conductivity–related performance.
Key topics & technical requirements
- Scope and purpose: Standardizes evaluation of CNT materials used in conducting composites; intended to assess batch-to-batch comparability and support material selection for electronic applications.
- Terminology and definitions: Harmonized terms for SWCNT, MWCNT, CNT film, sheet resistance (Ω/sq), I–V characteristics, 4-probe/4-point and 4-wire measurements.
- Sample preparation: Emphasizes forming uniform thin films (preferred) or ribbons rather than high-pressure pellets to avoid altering CNT properties. Reagents and dispersant selection (e.g., THF is recommended in the document) and CNT quantity for film formation are addressed.
- Measurement methods: Outlines experimental procedures for 4-point (4-probe) and 4-wire measurements to determine sheet resistance and resistivity of thin CNT films and ribbons, including recommended measurement geometries and electrode configurations.
- Data analysis & interpretation: Describes how to calculate sheet resistance and interpret results, including geometric factor corrections and correlating measured parameters to product performance.
- Practical validation: Includes case studies and references to support implementation and demonstrate how measured parameters link to end-use performance.
Applications & users
This technical specification is directly relevant to:
- Manufacturers and suppliers of CNT materials who need quality control and batch comparability metrics.
- R&D labs and engineers developing printed electronics, flexible displays, field-emission displays, conductive coatings, and other CNT-based conducting composites.
- QC and testing laboratories establishing electrical characterization workflows for CNT films.
- Procurement and standards/regulatory teams specifying material acceptance criteria based on electrical performance.
By providing a standardized method for measuring CNT film resistance and interpreting results, IEC/TS 62607-2-1 helps reduce variability, improve material selection, and accelerate adoption of CNT-based conductive materials.
Related standards (if applicable)
- Other parts of the IEC 62607 series (Nanomanufacturing – Key control characteristics)
- Vocabulary work under IEC/ISO TS 80004 (nanotechnology terminology)
- Relevant test-method standards referenced in the specification for 4-probe and thin-film measurements
Keywords: IEC/TS 62607-2-1, CNT film, carbon nanotube, sheet resistance, 4-point measurement, nanomanufacturing, SWCNT, MWCNT, film resistance, electrical conductivity.
Технические детали
- Технический комитет
- ISO/TC 229 - Nanotechnologies
- SKU
- IEC/TS 62607-2-1:2012
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