IEC TS 62607-6-2:2023

Name: IEC TS 62607-6-2:2023 — Nanomanufacturing - Key control characteristics - Part 6-2: Graphene - Number of layers: atomic force microscopy, optical transmission, Raman spectroscopy
SKU: IEC TS 62607-6-2:2023
Price: 35 EUR
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Nanomanufacturing - Key control characteristics - Part 6-2: Graphene - Number of layers: atomic force microscopy, optical transmission, Raman spectroscopy

Название (английский):

Nanomanufacturing - Key control characteristics - Part 6-2: Graphene - Number of layers: atomic force microscopy, optical transmission, Raman spectroscopy

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 24
Дата публикации:: 5 апреля 2023 г.
Издание:: IEC TS 62607 edition 1 version 1
ICS:: 07.120

Тип поставки:

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Цена:35 €

Описание (английский):

IEC TS 62607-6-2:2023 establishes a standardized method to determine the key control characteristic - number of layers for graphene flakes by a combination of - atomic force microscopy, - optical transmission, and - Raman spectroscopy

Abstract

Overview

Key Topics

Standardized Multi-Technique Approach The standard requires the use of three complementary analytical techniques-AFM, optical transmission, and Raman spectroscopy-applied in sequence or simultaneously to accurately determine graphene layer numbers.
Sample Preparation Guidance is provided for preparing graphene flakes using methods such as micromechanical cleavage, sonication, ball milling, and fluid dynamics, aligning sample characteristics with the requirements of subsequent measurement techniques.
Measurement Protocols Protocols for instrument calibration (AFM calibration using reference gratings, Raman calibration using silicon substrates, and optical reflectance calibration for detector linearity) are included to ensure reproducibility and traceability.
Data Analysis and Reporting The document outlines recommended steps for analyzing and interpreting the combined measurement data, detailing how to use peak intensities, thickness measurements, and optical contrasts to reliably distinguish mono- and multilayer graphene.
Terminology Detailed definitions of related terms (e.g., monolayer graphene, bilayer graphene, few-layer graphene, AFM, Raman peaks, optical contrast) foster a shared understanding across industries and research groups.

Applications

Quality Control in Graphene Manufacturing The standardized method allows graphene producers to provide consistent product quality, ensuring materials meet the exacting specifications needed for high-performance electronic, photonic, or composite applications.
Research and Development Academic and industrial researchers benefit from clear, universally recognized measurement criteria for graphene characterization, supporting reliable comparison and validation of experimental results.
Product Certification and Compliance Manufacturers of graphene-based components, such as transparent conductors, sensors, or flexible electronics, can use this standard to document material characteristics in line with global best practices, streamlining certification and market acceptance.
Supply Chain Communication Clear, standardized reporting on graphene characteristics supports transparent communication across the value chain, from graphene suppliers to device integrators and end users.

Related Standards

IEC TS 62607 Series This document is part of the wider IEC TS 62607 suite, which covers key control characteristics in nanomanufacturing for various nanomaterials beyond graphene.
ISO/TS 80004 Series Definitions for terms related to nanomaterials and measurement methods are harmonized with ISO/TS 80004, promoting consistency across international standards.
Relevant Instrumentation Standards The standard references calibration and measurement best practices as specified in documents such as ISO 18115 (surface chemical analysis vocabulary) and related ISO/IEC directives for standard development and harmonization.

By following IEC TS 62607-6-2:2023, organizations can ensure robust, reproducible assessment of graphene layer numbers using globally recognized techniques-supporting innovation, quality assurance, and regulatory compliance in nanotechnology and advanced materials sectors. For access to the full specification or more information, visit the IEC Webstore.

Технические детали

Технический комитет: TC 113 - Nanotechnology for electrotechnical products and systems
SKU: IEC TS 62607-6-2:2023

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IEC TS 62607-6-2:2023

Abstract

Overview

Похожие стандарты

Key Topics

Applications

Related Standards

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