IEC TS 62607-6-24:2026
Nanomanufacturing - Key control characteristics - Part 6-24: Graphene-related products - Number of layers of graphene: optical contrast
Nanomanufacturing - Key control characteristics - Part 6-24: Graphene-related products - Number of layers of graphene: optical contrast
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 21
- Дата публикации:
- 29 июня 2026 г.
- Издание:
- IEC TS 62607 edition 1 version 1
- ICS:
- 07.120
IEC TS 62607-6-24:2026 which is a Technical Specification, establishes a standardized method to determine the key control characteristic (KCC) • number of layer distribution for CVD graphene film by • optical contrast measurement The number of layers and number of layer distribution of CVD graphene film is derived by G‑channel contrast values. This method is applicable for clean CVD graphene film without twisted multilayer structures on a SiO2/Si substrate.
Abstract
Overview
IEC TS 62607-6-24:2026 - Nanomanufacturing - Key control characteristics - Part 6-24: Graphene-related products - Number of layers of graphene: optical contrast is a technical specification developed by the International Electrotechnical Commission (IEC). This standard establishes a globally applicable, standardized method for determining the key control characteristic-specifically, the number of layer distribution-for chemical vapor deposition (CVD) graphene films using optical contrast measurements. The methodology defined in this specification is intended for clean CVD graphene films, free of twisted multilayer structures, on SiO₂/Si substrates.
Monitoring and specifying the number of layers in graphene films is essential, as these features directly influence the electronic, mechanical, and optical properties of materials used in numerous advanced applications. The optical contrast method offers a reliable, efficient, and non-destructive means of characterizing layer distribution across large areas, supporting industrial-scale graphene manufacturing and quality control.
Key Topics
- Number of Layer Distribution: Specifies how to assess the distribution of mono- and multilayer domains within a CVD graphene film by analyzing optical contrast.
- Optical Contrast Measurement: Details a non-destructive technique using optical microscopy and digital imaging, focusing on the green channel (G-channel) value for high sensitivity to graphene layers.
- Measurement Procedure: Outlines steps including white balance calibration, sample preparation, optical imaging, data extraction from optical images, statistical analysis, and reporting results.
- Applicability: The method is tailored for clean, non-twisted CVD graphene films on standardized SiO₂/Si substrates.
- Data Analysis: Involves extracting G-channel contrast values from optical images, constructing statistical histograms, and determining area proportions for domains of different layer numbers.
- Reporting: Defines requirements for documenting test parameters, equipment details, optical images, contrast images, histograms, and comprehensive error analysis.
Applications
The standardized optical contrast method as defined by IEC TS 62607-6-24:2026 has broad relevance for various sectors within nanomanufacturing and graphene technology:
- Quality Control in Graphene Production: Enables efficient, non-destructive assessment of CVD graphene films' uniformity and layer distribution during large-scale manufacturing.
- R&D and Material Characterization: Supports researchers and developers in optimizing synthesis processes and evaluating fundamental material properties based on accurate layer characterization.
- Electronics and Optoelectronics: Ensures graphene films meet stringent criteria for next-generation electronic devices, sensors, transparent conductors, and optoelectronic components.
- Energy Storage and Conversion: Facilitates development of materials with tailored electrical and mechanical properties for use in batteries, supercapacitors, and fuel cells.
- Standardized Reporting and Compliance: Encourages harmonized documentation and traceability in the graphene industry, supporting regulatory compliance and international collaboration.
Related Standards
Professionals working with IEC TS 62607-6-24:2026 may find value in these related standards and references:
- IEC TS 62607-6-11:2022: Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy. This standard outlines Raman spectroscopy techniques for quantifying defect density in graphene.
- ISO/TS 80004‑13:2024: Nanotechnologies - Vocabulary - Part 13: Graphene and other two-dimensional (2D) materials. Provides essential terminology for the field.
- Other Parts of IEC 62607 Series: Covering key control characteristics for carbon nanotubes, graphene and related nanomaterials.
By providing clarity and consistency in measurement and reporting, IEC TS 62607-6-24:2026 supports reliable quality assurance and fosters innovation in nanomanufacturing involving graphene and advanced 2D materials.
Технические детали
- Технический комитет
- TC 113 - Nanotechnology for electrotechnical products and systems
- SKU
- IEC TS 62607-6-24:2026
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